• Ion Milling For TEM Samples Preparation
    Model 1051 TEM Mill

    "For many of today’s advanced materials, analysis by TEM is the best technique for studying material structure and properties. Fischione Instruments’ Model 1051 TEM Mill is an excellent tool for creating the thin, electron transparent specimens needed for TEM imaging and analysis.

    Ion milling with low angles of incidence, combined with low-energy ion source operation, minimizes irradiation damage and specimen heating. Because it facilitates the uniform thinning of dissimilar materials, low-angle milling is highly beneficial when preparing layered or composite materials, as well as cross-sectional TEM (XTEM) specimens.

    High energy operation for rapid milling; low energy operation for specimen polishing
    Two independently adjustable TrueFocus ion sources
    Ion source maintains its small beam diameter over a wide range of operating energies (100 eV to 10 keV)
    Continuously adjustable milling angle range of -15 to +10°
    Adjustable 10-inch touch screen with a user-friendly interface for simple setup of milling parameters
    Specimen holder with x-y adjustment
    In situ viewing and image capture during milling
    Liquid nitrogen-cooled specimen stage"

    Titan Krios

    The Titan Krios is the most powerful and flexible high resolution electron microscope for 2D and 3D characterization of biological samples. The Titan Krios optimal thermal and mechanical stability ensures perfect optical performance. The Titan Krios enables days of unattended operation and the combination with the automated sample loader results in unprecedented sample throughput.

    Titan Halo

    Based on the Titan Krios ultimate platform for biological imaging, Titan Halo combines versatility and flexibility with impressive, superior optical quality. Effective biological imaging at the nanoscale requires platforms which are able to take the lowest contrast, sensitive and valuable sample and turn it into revealing, insightful data. Titan Halo excels at delivering application versatility and flexibility without any compromise to optical stability.

    Titan ETEM

    Environmental Transmission Electron Microscope for dynamic in situ exploration of functional nanomaterials and devices at the nanometer and atomic scale.

    Built on FEI's world class Titan TEM platform, the Titan ETEM G2 atomic-resolution Scanning/Transmission Electron Microscope (STEM) is an all-in-one solution for time-resolved in situ studies of dynamic behavior of nanomaterials during exposure to gaseous environments. FEI's newest ETEM generation features an innovative differentially-pumped specimen area compatible with standard TEM holders for easy sample handling and full double tilt capability. The software-controlled user interface offers a range of settings to accommodate both handling by novice as well as by advanced operators. A mass spectrometer allows determination of gas composition; a built-in plasma cleaner allows for cleaning after using a gas. Built with the utmost consideration to safe operation, the Titan ETEM G2 complies fully with safety regulations and protocols for gas handling. Titan ETEM G2 is a flexible, easy-to-use solution for imaging of static specimens, observing nanomaterials' dynamic response to the applied stimulus, and observing growth, function, reliability and breakdown of nanodevices.

    Titan Themis

    The best gets better. Titan Themis TEM builds on the proven Cs corrected Titan platform to deliver the fastest time to data and the best S/TEM image quality for rapid access to crystal clear atomic scale images. With new Velox™ software, Piezo stage and Ceta 16M camera, Themis provides the power and speed demanded by today's materials researchers to achieve success at the extreme edges of discovery.

    Tecnai Artica

    The next generation automated, high resolution imaging TEM platform - Tecnai Arctica provides a platform which combines excellent optical performance and thermal and mechanical stability with high sample throughput. This new platform delivers increased data throughput using a new sample holder that allows for automatic loading of 12 samples. This results in high data throughput coupled with superior optical performance and stability; researchers gain a dramatic reduction in time to data results and achieve lower costs per structure.

    Metrios TEM

    The Metrios system is the first TEM dedicated to providing the fast, precise measurements that semiconductor manufacturers need to develop and control their wafer fabrication processes. Extensive automation of the basic TEM operation and measurement procedures minimizes requirements for specialized operator training. Its advanced automated metrology routines deliver greater precision than manual methods. The Metrios TEM is designed to provide customers with improved throughput and lower cost-per-sample than other TEMs.

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