• (1) STYLUS PROFILER
    Dektak XT

    The gold standard in stylus profiling

    The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds. This major milestone in stylus profiler performance is the culmination of over fifty years of Dektak® innovation and industry leadership. Through its combination of industry firsts, DektakXT delivers the ultimate in performance, ease of use, and value to enable better process monitoring from R&D to QC. The technological breakthroughs incorporated in DektakXT enable critical nanometer-level surface measurements for the microelectronics, semiconductor, solar, high-brightness LED, medical, and materials science industries.

    4 angstrom
    repeatability
    Delivers industry-leading accuracy.

    Single-arch
    design
    Provides breakthrough scan stability.

    Self-aligning
    styli
    Enables effortless tip exchange.

    FEATURES

    Accelerating Data Collection and Analysis
    Utilizing a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading performance. Vision64, Bruker’s 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.

    Delivering the Most Repeatable Measurements
    Implementing a single-arch structure makes the DektakXT sturdier, which minimizes the effects of environmental noise. DektakXT’s upgraded “smart electronics” reduce temperature variations and employ modern processors that minimize error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.

    Perfecting Operation and Analysis
    Bruker’s Vision64 software complements DektakXT’s innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customizable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you’re using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT’s Data Analyzer displays current data while also revealing other possible analyses.

    Making Things Easy
    The DektakXT’s self-aligning stylus assembly allows the user to quickly and easily change stylus size while eliminating any potential mishaps during the process. Bruker offers the widest range of stylus sizes to accommodate nearly any application need.

    Ensuring High Yield
    DektakXT provides the ability to quickly and easily set up and run automated multi-site measurement routines to verify the precise thickness of thin films across the wafer surface with unmatched repeatability. This efficient monitoring can save valuable time and money by improving yields.

    For more information please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektakxt.html

  • (1) TRIBOLOGY / MECHANICAL TESTING
    UMT TriboLab

    The most versatile tribology system ever designed

    Bruker’s Universal Mechanical Tester (UMT) platform has been the most versatile and widely used tribometer on the market since the first model debuted in 2000. Now, newly designed from the ground up, the UMT TriboLab™ builds on that legacy of versatility with a unique modular concept that harnesses more functionality than ever before—all without any compromise in performance. In fact, the UMT TriboLab offers higher speeds, more torque, and better force measurement than any of its competitors, plus it introduces powerful new features for improved efficiency and ease-of-use.

    Exceptional
    modularity
    Accommodates the full range of speeds and torques to perform nearly every possible tribology test.

    Broadest
    capabilities
    Enable an unprecedented breadth of testing under widest range of environments.

    Unmatched
    ease of use
    Removes the need to learn complex scripting languages or conventions.

    FEATURES

    Modular Drives for Maximum Versatility
    Quick changeover of drives using tool-less clamping allows the user to position the drive easily, then lock it into place in seconds. No cable connections are required for standard drives, and blind-mate connectors on the mounting ring automatically connect fans, sensors, and other electronics. Each hardware component includes a Tribo ID chip. Software interrogates the system, interprets the chip and “understands” the configuration without operator-entered commands.

    High-Load, High-Performance Sensors.
    The UMT TriboLab excels at producing highly accurate and repeatable test data by utilizing the latest developments in sensor technology from Bruker. These new “Gold Series” sensors offer noise levels at an industry-leading 0.02% of full scale values, with circuitry completely redesigned to reduce noise to an absolute minimum. The range of sensors also has been extended to eleven sensors, spanning forces from 1 milliNewton up to 2 kiloNewtons.

    Comprehensive Testing and Reporting Made Easy
    Through Tribo ID chips on the test hardware, the software “understands” the configuration and menus show only the active features. Utilizing an icon-based user interface, TriboScript allows you to simply drag and drop icons into the workspace to make test scripts. Only compatible icons interlock together, and the system prompts for needed variables, such as speed or force. TriboScript is also pre-loaded with many of the most frequently used standards, such as ASTM, DIN, JIS, etc. Finally, for post-test analysis and reporting, simply select the data channels you wish to consider, and the software will synchronize and display results to provide a complete understanding of what occurred during the test.

    Industry-Specific Solutions for Specialized Performance
    Bruker has utilized the versatility and modular architecture of the TriboLab platform to create turn-key kits for specific applications and industries. In addition to tailored hardware components, these modules feature software developed in conjunction with industry-leading manufacturers to address targeted standards. Bruker’s industry-specific solutions include Brake Material Screening, Clutch Friction Material Screening, HFRR Test, 3-Point-Bend Testing, and Hot-Hardness Testing.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/tribometers-and-mechanical-testers/umt-tribolab.html

  • (2) STYLUS PROFILER / LARGE SAMPLE
    Dektak XTL

    Gage-capable QA/QC profiler for optimal 300mm performance

    The Dektak XTL™ stylus profilometer accommodates samples up to 350mm x 350mm, bringing legendary Dektak® repeatability and reproducibility to large-format wafer and panel manufacturing. The Dektak XTL features pneumatic vibration isolation and a fully enclosed workstation with easily accessible interlocking door, making it ideal for today’s demanding production floor environments. Its dual-camera architecture enables enhanced spatial awareness, and its high level of automation maximizes manufacturing throughput.

    Robust
    automation setup and operation
    Programs fiducials and unlimited measurement sites to maximize throughput and minimize errors.

    Dual
    camera control
    Simplifies measurement setup and navigation to points of interest faster.

    Easy
    analysis and data collection
    Automates analysis routines and reports only desired features on complex samples.

    FEATURES

    Industry's Best Automation and Analysis Software
    Enhanced software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that enables unlimited measurement sites, 3D mapping, and highly customized characterization with hundreds of built-in analysis tools. Vision Microform software also measures shapes, such as radius of curvature. Pattern recognition minimizes operator error and enhances measurement location accuracy. The all-in-one software package combines data collection and analysis with an intuitive workflow.

    Unmatched Stylus Technology
    The Dektak XTL builds upon over 50 years of stylus expertise and application customization for production facilities to meet the stringent industry roadmaps of both today and tomorrow. The 300-millimeter, high-accuracy encoded XY staging gives manufacturers a reliable tool to meet stringent gage R&R requirements. Dektak’s Dual Camera Control with high-magnification dual view cameras offers enhanced spatial awareness. Point-and-click positioning in the live video allows operators to quickly place samples at the right location for quick and easy measurement setup and automation programming. The system’s large interlocked door provides safe and easy access for sample loading/unloading.

    Other hardware features include:

    • Single-arch architecture and integrated vibration isolation for industry-leading performance
    • Quick-change self-aligning stylus
    • High-accuracy encoded XY stage for faster automated data collection
    • N-Lite low force with Soft Touch technology and 1mm measurement range can be used simultaneously to measure delicate and high-vertical range samples

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/stylus-profilometers/dektak-xtl.html

  • (3) TRIBOLOGY / MECHANICAL TESTING / CMP
    TriboLab CMP

    R&D-scale process and material characterization system

    Leveraging over 20 years of CMP characterization expertise with its predecessor product (Bruker CP-4), TriboLab CMP brings a complete set of capabilities to the industry-leading TriboLab platform. The resulting accuracy and measurement repeatability enables the highly effective qualification, inspection, and ongoing functionality testing required throughout the CMP process. TriboLab CMP is the only process development tool on the market that can provide a broad range of polishing pressure (0.05-50 psi), speeds (1 to 500 rpm), friction, acoustic emissions, and surface temperature measurements for accurate and complete characterization of CMP processes and consumables.

    Unmatched
    ROI in a small-scale R&D system
    This benchtop tool reproduces full-scale wafer polishing process conditions without downtime on production equipment.

    Flexible
    parameter control
    Allows tailored testing to accelerate materials development and refine processes with accuracy.

    Expert
    applications and support
    Our many years in working in partnership with a large install base delivers expertise to your lab.

    FEATURES

    Small R&D-Scale Specialty System for CMP
    Bruker’s TriboLab CMP Process and Material Characterization System has been designed from the ground up specifically for reliable, flexible, and cost-effective bench characterization of wafer polishing processes.
    • Reproduces full-scale wafer polishing process conditions without downtime on production equipment
    • Provides unmatched measurement repeatability and detail
    • Allows testing on small coupons for substantial cost savings over whole-wafer testing

    On-Board Diagnostics for Better Understanding of Polishing Processes
    • Delivers more visibility into transient polishing properties than any other system on the market
    • Collects data from the instant the substrate touches the pad and throughout the entire test
    • Enables early-stage process development decisions through more complete, detailed data

    Flexibility in Sample Type, Size, and Mounting Configurations
    • Polishes any flat material, using virtually any conditioning disc, any slurry, and any pad
    • Accommodates small coupons through whole 100 mm wafers with ease
    • Accepts multiple sample mounts for flexibility

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/tribometers-and-mechanical-testers/tribolab-cmp.html

  • AFM / AUTOMATION / LARGE SAMPLE
    Dimension XR

    Extreme research systems for nanomechanics, nanoelectrical and nanoelectrochemistry

    Bruker’s Dimension XR scanning probe microscope (SPM) systems incorporate decades of research and technological innovation. With routine atomic defect resolution, and a host of unique technologies including PeakForce Tapping®, DataCube modes, SECM and AFM-nDMA, they deliver the utmost performance and capability. The Dimension XR family of SPMs package these technologies into turnkey solutions to address nanomechanical, nanoelectrical, and electrochemical applications. Quantification of materials and active nanoscale systems in air, fluid, electrical, or chemically reactive environments has never been easier.

    Hyperspectral
    nanoelectrical characterization
    Includes the most complete array of electrical AFM techniques for characterization of functional materials, semiconductors, and energy research.

    Sub-100nm
    electrochemical imaging
    Provides the highest resolution, total solution for quantitative analysis of local electrochemical activity associated with batteries, fuel cells, and corrosion.

    Out-of-the-box
    nanomechanical analysis
    Offers fully quantitative, turnkey suite of techniques for correlating structure and nanomechanical properties of materials.

    ENABLING FIRST-AND-ONLY AFM CAPABILITIES WITH HIGHEST PERFORMANCE

    Optimized Configurations for Advanced Research

    XR Nanomechanics
    XR Nanomechanics provides a range of modes to comprehensively detect the smallest structures with spatial resolution down to sub-molecular units of polymer chains. Researchers correlate nanomechanics data to bulk DMA and nanoidentation methods with our proprietary AFM-nDMA™ mode. Achieve quantifiable nanoscale characterization extending from soft sticky hydrogels and composites to stiff metals and ceramics.

    XR Nanoelectrical
    Dimension XR Nanoelectrical configuration covers the broadest array of electrical AFM techniques in a single system. Researchers capture electrical spectra in every pixel correlated with mechanical property measurements with the proprietary DataCube modes. This system delivers previously unattainable information from a single measurement.

    XR Nanoelectrochemical
    The nanoelectrical configuration enables robust AFM-based scanning electrochemical microscopy (AFM-SECM) and electrochemical AFM (EC-AFM). AFM operators acquire electrochemical information with <100 nm spatial resolution and perform simultaneous electrochemical, electrical, and mechanical mapping in a single system.

    Highest Resolution for All Modes, All Environments
    From point defects in liquid and stiffness maps to atomic resolution in air and conductivity maps, Dimension XR systems deliver highest resolution in all measurements. They utilize Bruker’s proprietary PeakForce Tapping technology to achieve both hard and soft matter performance benchmarks, including crystal defect resolution and molecular defects in polymers. The same technology plays an equally important role in resolving the smallest asperities on roughened glass over hundreds of images. The systems combine PeakForce Tapping with extreme stability, unique probes technology, and Bruker’s decades of experience in tip scanning innovation. The result is highest resolution imaging consistently, completely independent of sample size, weight, or medium – and for any application.

    Revolutionary AFM-nDMA
    For the first time an AFM can provide complete and quantitative viscoelastic analysis of polymers at the nanoscale, probing materials at rheologically relevant frequencies, in the linear regime. Proprietary dual-channel detection, phase-drift correction, and reference frequency tracking enable a small strain measurement in the rheologically relevant 0.1 Hz to 20 kHz range for nanoscale measurements of storage modulus, loss modulus, and loss tangent that tie directly to bulk DMA.

    Proprietary DataCube Modes
    These modes utilize FASTForce Volume to perform a force-distance spectrum in every pixel, with a user-defined dwell time. Using high data capture rates, a multitude of electrical measurements are performed during the dwell time, resulting in electrical and mechanical spectra at every pixel. DataCube modes provide full characterization in a single experiment, which is unheard of in a commercial AFM.

    Exclusive PeakForce SECM
    With a spatial resolution less than 100 nm, this mode redefines what is possible in the nanoscale visualization of electrical and chemical processes in liquid. PeakForce SECM dramatically improves, by orders of magnitude, the resolving power over traditional approaches. This enables entirely new research into energy storage systems, corrosion science and biosensors, opening the door to novel measurements on individual nanoparticles, nanophases, and nanopores. Only, PeakForce SECM provides simultaneous capture of topographic, electrochemical, electrical, and mechanical maps with nanometer-scale lateral resolution.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-xr-afm.html

  • AFM / FAST SCAN
    Dimension Fastscan

    First-and-only no-compromise high-speed AFM

    The Dimension FastScan® atomic force microscope (AFM) system is specifically designed to scan fast without loss of resolution, loss of force control, added complexity, or additional operating costs. With FastScan you achieve immediate AFM images with the expected high resolution of a high-performance AFM. Whether you scan at >125Hz when surveying a sample to find the region of interest, or at time rates of 1-second per image frame in air or fluid, FastScan redefines the AFM experience.

    No-compromise
    high-speed performance
    Delivers highest resolution any time, every time, independent of sample size.

    Real-time
    nanoscale dynamics
    Provide ultimate tip-scanning speed and stability for direct visualization of dynamic behavior in air or fluid.

    Automated
    setup, data acquisition, and analysis
    Makes system operation surprisingly simple while enhancing prductivity, allowing you to focus on your research.

    FEATURES

    Benchmark for High Speed and High Resolution
    Dimension FastScan is the first-and-only high-speed tip-scanning system that achieves frames per second scan rates without compromising resolution or system performance – independent of sample size. No other high-speed AFM has the large sample access of the FastScan. Coupled with PeakForce Tapping®, the system achieves instantaneous force measurement with a linear control loop, allowing point defect dimensional and mechanical resolution, and not just on hard, flat crystals.

    Exceptional Productivity
    Every facet of the Dimension FastScan — from wide-open tip and sample access to preconfigured software settings — has been specifically engineered for trouble-free, surprisingly simple operation. Fast sample navigation, fast engaging, fast scanning, low-noise, less than 200 pm per minute of drift rate over hours, an expanded intuitive user interface, and the world-renowned Dimension platform combine to deliver an entirely new experience in AFM, while ensuring high-quality data with faster time to results and publication. FastScan users can achieve immediate high-quality results without the usual hours of expert tweaking.

    More Applications and New Insights Faster
    Sample surveying is a common way to explore unknown samples to understand heterogeneity, unique feature characteristics, and mechanical properties. Here are the results of a FastScan sample survey, which produced a set of high-quality images ranging from high-resolution topography images of a 20 μm area to subsections 10 times smaller than the original scan. The results from one 8 minute scan are 16 megapixels of data in multiple channels, where high-resolution data is observed with clarity.

    AFM MODES
    Expand Your Applications with AFM Modes
    With an unrivalled suite of imaging modes available, Bruker has an AFM technique for every investigation.

    Built on the backbone of core imaging modes—Contact Mode and Tapping Mode—Bruker offers AFM modes that allow users to probe their samples’ electrical, magnetic, or materials properties. Bruker’s innovative new PeakForce Tapping technology represents a new core imaging paradigm that has been incorporated into several modes, providing topographic, electrical, and mechanical properties data in parallel.

    For more information please visit:
    https://www.bruker.com/en/products-and-solutions/microscopes/materials-afm/dimension-fastscan.html

  • AFM / IR
    Anasys NanoIR3

    Highest performance sub-10 nm resolution nanoIR spectroscopy

    The nanoIR3 is the latest generation nanoscale IR spectroscopy, chemical imaging, and property mapping system for both materials and life science applications. The system also provides IR-based chemical imaging to provide mapping of chemical variations of the feature of interest. Unique point spectroscopy capabilities provide both spectroscopy and chemical imaging with a single source.

    Model-free
    IR spectroscopy
    Enables reliable acquisition of nanoscale absorption data.

    Sub-10nm
    Tapping AFM-IR
    Performs chemical mapping at the highest spatial resolution, while providing high-quality IR spectroscopy.

    HYPERspectral
    imaging
    Extends spectroscopic range for a broader range of applications.

    Complete Nanoscale Characterization
    The nanoIR3 provides a comprehensive set of capabilities for nanoscale characterization. The unique POINTspectra feature provides both point spectroscopy and chemical imaging with a single laser source, enabling faster time to data and, ultimately, a more cost-effective research solution. Hyperspectral Imaging provides the ability to create a 3D spectral map of the surface within to help identify unknowns and export for additional processing.

    High-Performance Monolayer Sensitivity
    Bruker’s proprietary Resonance-Enhanced AFM-IR mode provides the highest performance, rich, high-quality spectra to help identify materials at the nanoscale and better understand material changes and composition. From thin films to monolayers, Resonance-Enhanced AFM-IR is the most sensitive technique for nanoscale spectroscopy of organic materials.

    Tapping AFM-IR Chemical Imaging
    Incorporating proprietary technology and building upon years of industry-leading Anasys AFM-IR instrument development, the nanoIR3 is the highest performance nanoscale IR. Our patented Tapping AFM-IR imaging technique creates chemical mapping of the highest spatial resolution, while providing high-quality IR spectroscopy. Whether your goal is creating chemical composition maps of polymers, thin films, monolayers, or small, thin contaminants, obtaining high-resolution chemical imaging is easy and fast with Tapping AFM-IR.spectroscopy, chemical imaging, and materials property mapping system available today for materials and life science applications.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/infrared-and-raman/nanoscale-infrared-spectrometers/Anasys-nanoir3.html

  • AFM / LIFE SCIENCE
    JPK NanoWizard® AFM

    Specialized solutions for applications ranging from BioAFM and Polymer Research to Surface Science and NanoOptics

    The NanoWizard® is the most flexible high-end AFM on the market. It sets the benchmark in resolution, speed and stability in particular for fluid applications. All NanoWizard® systems provide true integration of AFM with optical microscopy by means of our patented DirectOverlay™ feature for precise and easy work, and comes with a large variety of options and accessories. In addition, the NanoWizard® family comes with the QI™ Mode, an easy and intuitive imaging mode for quantitative imaging.

    NanoRacer® High-Speed AFM
    True high-speed imaging at 50 frames per second and exceptional usability for following molecular dynamics in real-time

    NanoWizard® ULTRA Speed 2 AFM
    High-speed imaging and super-resolution AFM on inverted microscopes, paired with unparalleled flexibility.

    NanoWizard 4 XP BioScience AFM
    Extreme performance and ease of use for applications in Life Science and Soft Matter research ranging from single molecules to living cells and tissues.

    NanoWizard 4 XP NanoScience AFM
    Extreme performance and highest flexibility for applications in materials and polymer science ranging from nanomechanics and electrochemistry to electrical and magnetic measurements.

    NanoWizard® Sense+ AFM
    The perfect start to AFM, for applications in material and life sciences.

    NanoWizard® NanoOptics AFM
    Comprehensive solution for advanced experiments which combine AFM and optical spectroscopy such as TERS, Aperture SNOM and sSNOM, confocal microscopy and nano manipulation in optical fields.

    BioMAT™ Workstation
    For opaque samples, combining upright optical microscopy with AFM for surface science and life science.

    OT-AFM Combi-System
    NanoTracker™ & NanoWizard® - Powerful combination of Optical Tweezers & AFM in one system for force measurements in 2D and 3D from 500fN to 10nN.

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy

  • AFM / LIFE SCIENCE / INVERTED MICROSCOPE
    NanoWizard® ULTRA Speed 2 AFM

    A new benchmark: True atomic resolution and high-speed imaging with 10 frames/sec

    The JPK NanoWizard® ULTRA Speed 2 delivers exceptional performance and unmatched user-friendliness. It reaches speed levels previously unattainable with traditional AFMs and combines true atomic resolution and fastest scanning with rates of 10 frames/sec. Real-time, in-situ experiments can be performed in combination with advanced optics. A broad range of modes and accessories makes the system highly flexible and upgradable.

    The NanoWizard ULTRA Speed 2 provides a range of new features:
    • NestedScanner Technology for high-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    • PeakForce Tapping® for easy imaging
    • New tiling functionality for automated mapping of large sample areas
    • V7 Software with revolutionary new workflow-based user interface
    • DirectOverlay™ 2 software for perfect integration and data correlation with advanced fluorescence microscopy platforms
    • Vortis™ 2 controller for high-speed signal processing and lowest noise levels

    High-speed imaging of surface structures up to 8µm with outstanding resolution and stability
    The system comes with the lowest noise and highest stability available on the market to provide true atomic resolution. Direct force control at ultra-low forces prevents damage to your samples and probes. With the state-of-the-art position sensor technology, the system delivers highest accuracy and maximum precision.

    Until now, performing dynamic experiments on living cells, highly corrugated samples or steep surface structures with highest spatial and temporal resolution was challenging. With our new NestedScanner technology, cells, bacteria or structured surfaces with samples heights up to 8µm can now be examined at the highest scan speeds.

    • Observe sample dynamics in real-time with highest resolution
    • Access to corrugated and higher surfaces with the NestedScanner technology
    • Combine AFM and optical fluorescence microscopy for multiparametric in-situ experiments
    • Enhance productivity, probe more sample positions faster

    Key features
    • High-speed imaging with 10 frames/sec with excellent resolution
    • Now with Bruker’s exclusive PeakForce Tapping as standard
    • Revolutionary new workflow-based user interface for ergonomics and ease of operation
    • New tiling functionality for automated mapping of large sample areas together with the HybridStage
    • Unique integration with optical microscopy by tip-scanning design and the newly enhanced DirectOverlay 2 mode for most precise correlative microscopy
    • New Vortis 2 controller with high-speed low-noise DACs and cutting-edge position sensor readout technology
    • Highest flexibility and upgradeability with a broad range of modes and accessories

    For more information, please visit:
    https://www.jpk.com/products/atomic-force-microscopy/nanowizard-ultra-speed-2

  • AUGER ELECTRON SPECTROSCOPY (AES) / SURFACE ANALYSIS / SPECTRAL ANALYSIS
    PHI 710

    Auger Electron Spectroscopy (AES, Auger) is an analytical technique that provides compositional and distributional information of elements on the top few monolayers of a material by irradiating an electron beam to the surface of a solid material and measuring the energy of Auger electron emitted from the sample surface. The PHI 710 Scanning Auger Nanoprobe is a high performance surface analysis system that provides nanometer level Auger analysis. The acoustic enclosure and the built-in vibration isolators allow compositional and distributional measurement by 500,000 magnification that conventional Auger system never achieved.

  • Automated multipurpose X-ray diffractometer (XRD) with Guidance software
    SmartLab (XRD)

    SmartLab®
    Rigaku SmartLab is the newest and most novel high-resolution X-ray diffractometer (XRD) available today. Perhaps its most novel feature is the new SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment. It is like having an expert standing by your side.

    Features
    Available in-plane arm (5-axis goniometer)
    Highest flux X-ray source: PhotonMax
    HyPix-3000 high energy resolution 2D HPAD detector
    New CBO family, with fully automated beam switchable CBO-Auto and high-resolution micro area CBO-μ
    Operando measurements with SmartLab Studio II software
    Multi-year component warranty contributes to low cost of ownership" 250 in speed and provides adjustable energy resolution of approximately 20% or 4% depending on sample type.
    Integrated intelligent Guidance software enables fully automated measurement including optics and sample alignment.
    Self-aligned optics maximize instrument uptime and minimize cost of ownership.

  • Automated Systems for Automotive Industry
    AZS.4 – COMPATIBLE AUTOMATIC LINE FOR INSTALLATION AND TESTING PKW CLUTCHES

    Complete automated line for production and 100% mechanical inspection and adjustment of PKW couplings including balancing according to special dynamic adjustment algorithm and special camera control with the possibility of division into IO and NIO + and NIO-pieces. The line is made up of several separate parts. LABORTECH ensures the functionality of the entire line.

  • Automated Systems for Automotive Industry
    AZS.3 – AUTOMATIC WORKING STATIONS FOR THE MEASUREMENT OF CNG BOTTLES HARDNESS

    Automatic stationary hardness testers designed for HB and HV measurement. Built-in production and testing lines, they are used for 100% hardness check according to EN ISO 6506-1. These systems can measure e.g. CNG bottles after heat treatment, seamless pipes, round forgings etc. The conveyor system can be adjusted according to the dimensions, shape and weight of the measured piece and requirements.

  • Automated Systems for Automotive Industry
    AZS. 2 – AUTOMATED ROBOTIC WORKSTATIONS FOR NOTCH TOUGHNESS TESTS

    Automated Robot Systems X RUNNER designed for accurate and fast handling of impact notch toughness specimens in conjunction with LABORTECH CHK pendulums. These robotic systems are made in several modifications, depending on how many specimens will be tested within 24 hours, what types of specimens and at what temperatures. Based on these requirements, the robotic workplace is precisely specified.

  • Automated Systems for Automotive Industry
    AZS. 1 – AUTOMATED ROBOTIC WORKSTATIONS FOR TENSILE, COMPRESSION, BENDING TESTS

    The YELLOW RUNNER automated robotic test systems are designed for precise and fast specimens handling in conjunction with Electromechanical Test Systems LabTest E series. Thanks to the modular design, various peripherals: specimens size measurement, broken sampling boxes, extended storage systems, etc., can be connected to our robotic test systems.

  • Automatic X-Ray Inspection System 3D and Transmission
    Matrix Technologies X3

    The X3 is an automatic X-Ray inspection system featuring combined Transmission and 3D Technology for sophisticated high-speed inspection in electronic production. The system is based on the motion concept of the MatriX X2.5 AXI system. A newly developed 3D reconstruction software generates slice images for 3D analysis of solder joints. Main applications are double-sided boards with critical overlapping areas.
    MIPS_Tune is an off-line programming software package for test program generation with automatic CAD import and for graphical application parameter tuning. It features an automatic inspection list generation based on an advanced algorithm library for transmission and off-axis joint inspection.
    Proprietary Tree-Classification technique with integrated automatic rule generation, graphical
    measurement & yield display for program optimization.
    The verification software module MIPS Verify with its closed-loop repair concept is capable of in-line or offline verification using a graphical board layout display and X-ray image with defect marking. Support of multiple inspection modes with parallel viewing of transmission oblique view and optical images of the same defect for easy and reliable defect verification. MIPS_SPC – process control tools for real-time and history statistics.

  • AUTOMOTIVE testing
    AS.3 – TESTING AND CONTROL OF PKW CLUTCHES – INSTALLATION, TESTING AND ADJUSTMENT LINES

    EDHTest 6.2022 Special Electromechanical Carousel Testing Machine … designed for 100% inspection and adjustment of complete convex and XTD PKW couplings in assembly, test and adjustment lines. These machines are characterized by low test and adjustment timing, velocity and very precise measurement of thrust and release forces, inaccuracies, flatness measurement, and XTD system setup in the serial line.

  • AUTOMOTIVE testing
    AS.2 – TESTING AND CONTROL OF PKW CLUTCHES – INSTALLATION, TESTING AND ADJUSTMENT LINES

    Special Electromechanical Carousel Testing Machine series EDHTest 5.2021 … designed for 100% inspection and adjustment of complete convex and XTD PKW couplings in assembly, testing and adjustment lines. These machines are characterized by velocity and precise precision measurement of thrust and release forces, thumbflakes, flatness measurement and XTD system setup in the serial line.

  • Bomb Calorimeter, Calorific Value
    CAL3K CALORIMETER SERIES

    CAL3K Calorimeter is an advanced bomb calorimeter systems with innovative technology and advanced features to suit your analytical needs.

    CAL3K Calorimeter is used to determine the calorific value of liquid and solid samples and is manufactured with various applications mind, including but not limited to : animal feed research, waste product analysis, explosives analysis, fuel and oil analysis, coal and coke analysis, food & nutrition and university research.

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS
    C-SAM (AW Series)

    The AW™ Series are advanced high-capacity, high throughput, automated C-SAM® instruments specialized for maximum sensitivity for evaluation of wafer bond applications. The AW Series delivers a better than 5 micron sensitivity, throughputs that are approximately two times faster than competitive systems and non-immersion scanners that eliminate false positives due to DI water ingression. The AW Series automatically handles, inspects and sorts boned wafers based on user-defined accept/reject criteria and are designed to handle wafers bonded by virtually any method, including direct fusion, anodic, glass frit and epoxy bonding.

  • CONFOCAL SOUND ACOUSTIC MICROSCOPE / ELECTRONICS / QUALITY CONTROL
    C-SAM (GEN 6)

    The Gen6™ C-Mode Scanning Acoustic Microscope is the newest generation in Acoustic Microscopy Imaging (AMI) innovation. While taking the best from the Gen5™ (e.g. advanced features, aesthetics, and ergonomics), the Gen6 improves upon the rest and takes acoustic imaging to the next level.

    The Gen6 delivers the broadest range of capabilities available. Whether your needs are for nondestructive failure analysis, process development, R&D, High-Rel qualification for a military application, or low/medium-volume screening, the Gen6 is the one C-SAM system that can meet all of your demands. Gen6 is perfect for a variety of applications, such as; Microelectronics, MEMS, SSL LEDs, Power Modules, Solar, High-Tech materials, etc.

    As the ultimate laboratory analysis tool, the Gen6 includes SonoSimulator as a standard feature to simplify the analysis of devices with multiple thin layers.

    Advanced Sonoscan capabilities such as PolyGate™, Virtual Rescanning Mode (VRM™), and available Frequency Domain Imaging (FDI™) add value and confidence. With its large, easy-access, illuminated scanning area, the Gen6 has the capability to efficiently scan everything from a single part, to a 300mm wafer, with its tower referenced scan and fixtures.

    In addition to being packed with leading Sonoscan innovations, the Gen6 was carefully designed with the user in mind. Its ergonomic features make it comfortable and convenient to use. Its advanced applications Sonolytics™ software and new intuitive operator interface menus help maximize results, while saving operator time. Plus, its open access and illuminated tower referenced sample stage allow for easier loading and unloading of samples. The Gen6 is truly the new generation C-SAM, delivering a package of technology, ergonomics, and advanced Sonoscan-developed features that cannot be found anywhere else.

  • CREEP Testing
    C. 1 – TESTING MACHINES CREEP WITH LEVER MECHANISM AND WEIGHT

    The C.1 mechanical testing machines series in a vertical floortop design up to 50kN, which maintain a constant load using lever mechanisms, weights and gravity forces. These machines are designed to perform long-term CREEP tests, creep determination, relaxation of material stress, etc. This series of machines is characterized by high rigidity of the frame, cohesiveness and mechanical resistance.

  • CREEP Testing
    C. 3 – TESTING MACHINES CREEP WITH A LOW-SPEED AC DRIVE

    The electromechanical C.3 testing machines in a vertical floortop design up to 500kN to maintain constant load using a central loading mechanism consisting of a central ball screw and a special storage of a precise cycloidal gearbox with an integrated AC servo drive. These machines are designed to perform long-term CREEP tests, creep determination, relaxation of material stress, etc. This series of machines is characterized by high rigidity of the frame, cohesiveness and mechanical resistance.

  • CREEP Testing
    C. 5 – CREEP TEST MACHINES FOR QUASI – DYNAMIC CYCLING TESTING

    Electromechanical testing machines of the C.5 series in vertical floortop design up to 500kN designed for quasi – dynamic cyclic testing and long-term testing. Permanent exact load with the possibility of cycling up to 2Hz is ensured by means of a central loading mechanism consisting of a central ball screw and a special bearing of a accuracy cycloid gearbox with an integrated AC servo drive. These machines are designed for long-term CREEP tests, creep determination, material stress relaxation, etc. This series of machines is characterized by high frame rigidity, alignment and mechanical resistance.

  • Drop weight Testing
    DP. 3 – DROP WEIGHT TESTERS SERIES UP TO 120 000J

    High capacity DP.3 series with nominal energy up to 120 000 J are designed to perform tests of materials and specimens of high energy range. Our equipment is used to test and simulate the behaviour of materials and components at different speeds, energies, and impact heights. The drop weight testers are manufactured in several modifications from 20 to 120kJ, without instrumentation, with instrumentation and are designed to fully meet all customer requirements and testing standards according to EN, ISO, ASTM, BS or NF in conjunction with an integrated touch screen LCD and a PC with DROPTest software.

  • Drop weight Testing
    DP. 1 – DROP WEIGHT TESTERS SERIES UP TO 150J

    DP.1 series of low-capacity drop weight testers with nominal energy up to 150J are designed to perform tests of materials, specimens and components of diverse shapes in a wide range of very low energies. Our equipment is used to test and simulate the behaviour of materials and components at different speeds, energies, impact heights, collisions, accidental falls and repeated strokes. This system can be equipped with instrumentation as well as a wide range of spikes and strikers available for testing according to EN, ISO, ASTM, BS or NF standards.

  • Drop weight Testing
    DP. 2 – DROP WEIGHT TESTERS SERIES UP TO 3000J

    Low capacity DP.2 series of drop weight testers with nominal energy up to 3000J are designed to perform tests of materials, specimens and components of various shapes in a wide range of low and medium energies. Our equipment is used to test and simulate the behaviour of materials and components at different speeds, energies, impact heights, collisions, accidental falls and repeated strokes. The drop weight testers are made in several modifications and are designed to fully meet all customer requirements and testing standards according to EN, ISO, ASTM, BS or NF in conjunction with an integrated touch screen LCD and a PC with DROPTest software.

  • Dynamic and fatigue testing system
    H.5 – VERTICAL DYNAMIC TESTING MACHINES UP TO 1MN

    The dynamic H.5 series vertical servo-hydraulic testing machines in vertical design up to 1MN are designed for low and high cycle fatigue tests, fracture toughness, crack propagation, etc. This range of machines is characterized by high frame stiffness and mechanical resistance. The range of the machine depends on the dynamic stroke and frequency. From these parameters, a specific test set consists of a test frame, a servo-hydraulic cylinder and a hydraulic aggregate.

  • Dynamic and fatigue testing system
    H.6 – HORIZONTAL DYNAMIC TESTING MACHINES UP TO 2MN

    Dynamic servo-hydraulic testing machines of the H.6 series in horizontal design up to 2MN are designed for low and high cycling fatigue tests. This range of machines is characterized by high frame stiffness and mechanical resistance. The scope of the machine depends on the dynamic stroke, frequency and type of product tested. From these parameters, a specific test set consists of a test frame, a servo-hydraulic cylinder and a hydraulic unit.

  • Dynamic and fatigue testing system
    H.8 – VERTICAL DYNAMIC AXIALLY-TORSIONAL TESTING MACHINES UP TO 1MN

    The vertical dynamic axial torsion testing machines series H.8 with adjustable test area are designed for safe and efficient testing of materials and whole products in tensile, compressive, torsional and bending dynamic mode. This range of machines is characterized by high frame stiffness and mechanical resistance. A wide range of hydraulic units enables dynamic loading of specimens up to Fmax. 1.2MN and frequency 100 Hz.

  • Dynamic and fatigue testing system
    H.10 – DYNAMIC TESTING BENCHES

    Dynamic hydraulic test stands of the H.10 range are designed for forces up to 1MN and use T-groove platens or load-bearing platforms. They are designed to perform low and high cycle fatigue tests on parts or whole products. This range of machines is characterized by high frame stiffness and mechanical resistance. The range of the machine depends on the dynamic stroke, the test force, the frequency and the size of the specimen. From these parameters, a specific test set consists of a test frame – a T groove plate, a combined servo-hydraulic cylinder and a hydraulic unit.

  • Dynamic and fatigue testing system
    H.11 – DYNAMIC SERVO-HYDRAULIC BIAXIAL TESTING MACHINE UP TO 500 KN

    Servo-hydraulic dynamic biaxial cruciform testing machines of the H.11 series are designed for low and high-cycle multi-axis fatigue tests, crack propagation, etc. This series of machines is characterized by high frame stiffness with long life, mechanical resistance and self-absorbing resonances. The wide range of hydraulic units allows for dynamic loading of samples to Fmax. 500kN and frequency up to 50 Hz.

  • Dynamic Balancing Testing
    VSH. 1 – HORIZONTAL BALANCING MACHINES

    Horizontal balancing machines VSTest by LABORTECH are designed for dynamic balancing of rotors in the horizontal direction of the rotation axis. Thanks to a large portfolio of products, we offer horizontal balancing machines for different sizes and weights of balancing items, with different balancing adjustments. For these machines, cardan, belt or custom drive can be used. These machines are manufactured in several modifications and are designed to be fully cooperative with the operator of the machine in conjunction with the integrated touch screen LCD monitor and a fully-fledged PC with BALANCERTest software.

  • Dynamic Balancing Testing
    VSV. 1 – VERTICAL BALANCING MACHINES

    Vertical balancing machines VSTest by LABORTECH are designed for dynamic rotor balancing in the vertical direction of the rotation axis. These machines can balance rotors without their own shaft, turbines, brake discs, clutches, lamellae, etc., which are attached to the balancer spindle. This spindle is terminated by a clamping device adapted to the given balancing piece, with the possibility of varying imbalance correction. These machines are manufactured in several modifications and are designed to be fully cooperative with the operator of the machine in conjunction with the integrated touch screen LCD monitor and a fully-fledged PC with BALANCERTest software.

  • Handheld XRF
    Vanta

    The Vanta analyzer is our most advanced handheld X-ray fluorescence (XRF) device and provides rapid, accurate element analysis and alloy identification to customers who demand laboratory-quality results in the field.

    Vanta handheld XRF analyzers are built to be tough. Their rugged and durable design makes them resistant to damage for greater uptime and a lower cost of ownership.

    With intuitive navigation and configurable software, the Vanta series are easy to use with minimal training for high throughput and a fast return on investment. Featuring innovative and proprietary Axon technology, Vanta analyzers give you accurate results and help boost productivity no matter the environment or working conditions.

    Exceptional durability under extreme conditions.
    Analytical superiority.
    Optional Wireless LAN and Bluetooth® for real-time data sharing. Cloud technology enabled.
    Intuitive user interface.

  • Handheld XRF
    Delta Element

    The DELTA Element is the most affordable unit in the Olympus line-up of handheld X-ray fluorescence (XRF) analyzers designed for fast, accurate results. Fast, simple and reliable, the DELTA Element incorporates the features and rugged design of the DELTA family. With fast elemental ID for screening, sorting and metal analysis, the DELTA Element provides fast ROI for Scrap, PMI, QA / QC and Jewelry / Precious Metals applications.

    With a powerful X-ray tube and Si-PIN detector, the DELTA Element is ideal for simple applications. It provides quick ID, screening, sorting and elemental and metal analysis.

    The DELTA Element offers fast measurement with results in seconds, low limits of detection, and outstanding precision.

    The DELTA Element's field-worthy and rugged design features rubber overmolds and an ergonomic grip to protect the analyzer. To avoid downtime, the hot swap feature allows the batteries to be swapped out while the analyzer is in use. The DELTA Element features wide area heat sinks for high power use in extreme temperatures.

    Olympus' exclusive Grade Match Messaging (GMM) feature provides information to simplify verification and streamline operations. Users can assign customized messages to any grade and use real-time or pop-up messages for immediate sorting instructions and improved user efficiency.

  • High resolution CT X-Ray Inspection System Transmission & CT
    Matrix Technologies XCT-1000

    The XCT-1000 series systems meet the most stringent demands in CT X-ray. With this Computed Tomography system, MatriX Technologies GmbH offers the highest possible flexibility for individual customer requirements. This space-saving system can be equipped with different X-ray powers, from 130kV up to 190kV with nano/micrometer resolution. The XCT-1000 is especially suitable for the inspection of small to medium production volumes or for the use in laboratory environment.
    The XCT-1000 systems are capable of processing the Siemens CERA-TXR technique with exact
    Volume reconstruction by using the latest CMPtechnology for automatic geometrical correction
    and calibration. This fast, real-time CT reconstruction technique provides cone artefact free images with automatic volume slice separation and automatic analysing functionalities.
    The flexible manipulator system allows different and optimized magnification-setups depend on
    sample sizes and geometry.
    The XCT-1000 system is ideal for non-destructive testing, materials investigations and, in particular,
    dimensional measurements for internal structures, undercuts and free form surfaces.

  • Impact Testing, Pendulum impact testers
    CHK.2 – PENDULUM IMPACT TESTERS LABTEST CHK 450J

    Pendulum impact testers series CHK. 2 with nominal energy up to 450J belong due to their accuracy, reliability, ergonomic layout and originality in evaluation of the test among the world´s top class in the field of impact tests by methods Charpy, IZOD and tensile impact tests according to standards EN, ISO, ASTM, DIN and GOST. Our pendulum impact testers are manufactured in several modifications and are designed to fully meet the machine operators demands in conjunction with an integrated touchscreen LCD monitor and a full-featured PC with the IMPACTTest software.

  • Impact Testing, Pendulum impact testers
    CHK.3 – PENDULUM IMPACT TESTERS CHK 750J

    Pendulum impact testers series CHK. 2 with nominal energy up to 750J belong due to their accuracy, reliability, ergonomic layout and originality in evaluation of the test among the world´s top class in the field of impact tests by methods Charpy, IZOD and tensile impact tests according to standards EN, ISO, ASTM, DIN and GOST. Our pendulum impact testers are manufactured in several modifications and are designed to fully meet the machine operators demands in conjunction with an integrated touchscreen LCD monitor and a full-featured PC with the IMPACTTest software.

  • Impact Testing, Pendulum impact testers
    CHK.1 – PENDULUM IMPACT TESTERS LABTEST CHK 50J

    The pendulum impact testers series CHK. 1 in benchtop design with nominal energy up to 50J belong due to their accuracy, reliability, ergonomic layout and originality in evaluation of the test among the world´s top class in the field of impact tests. Impact pendulum testers up to 50J are designed to suit the operator ergonomically and functionally in conjunction with a bench. Unique touch screen integration concept with full PC including IMPACTTest software.

  • LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    3D Measuring Laser Microscope | LEXT OLS5000

    The OLS5000 3D measuring laser microscope scans laser light over the surface of a sample to provide enlarged images of micro-scale features and to perform shape measurements of surface roughness, steps, and other features.

    The LEXT OLS5000 microscope is the successor to the OLS4100 microscope and offers significantly improved measurement performance. New 4K scanning technology and enhanced optics designed specifically for the LEXT OLS5000 microscope enable the detection of near-perpendicular features and small steps at close to the nanometer scale. The microscope comes with intuitive software designed for usability with features including the ability to automate settings that previously had to be specified by the operator. Large samples or samples with an uneven surface can be measured thanks to the addition of an expansion frame that can accommodate samples up to 210 mm tall and a long working distance objective lens designed specifically for the OLS5000 microscope. This provides support for sophisticated user requirements from performing observations through data acquisition, analysis and reporting.

    Main Features
    1. Enhanced measurement reliability thanks to 4K scanning technology and optics designed specifically for the OLS5000 microscope
    2. Data acquisition that is four times faster than the previous model and intuitive software
    3. Accommodates samples up to 210 mm tall and concavities up to 25 mm deep using an expansion frame and long working distance objective lens

  • LASER CONFOCAL MICROSCOPE / NON-DESTRUCTIVE
    3D Measuring Laser Microscope | LEXT OLS5100

    Built for failure analysis and material engineering research, the OLS5100 laser microscope combines exceptional measurement accuracy and optical performance with smart tools that make the microscope easy to use. Precisely measure shape and surface roughness at the submicron level quickly and efficiently to simplify your workflow with data you can trust.

    Simplify Your Measurement Testing Workflow
    The microscope’s Smart Experiment Manager helps users manage the planning, acquisition and analysis phases of their experiments. The microscope scans samples according to a customized experiment plan generated by the software, helping to keep users from missing data or redoing work. During analysis, the software’s trend visualization tools make it easier for users to spot problems.

    Data You Can Trust
    The OLS5100 microscope’s Smart Lens Advisor takes the guesswork out of selecting the right objective lens when measuring surface roughness. In three simple steps, the Advisor rates the objective lens based on the application, so users know they are using the right objective.

    Reliable Data at the Push of a Button
    Some laser microscopes are complicated, but the OLS5100 microscope makes data acquisition simple—just place a sample on the stage and press the start button. The microscope will make all necessary setting adjustments and acquire the data.

    With outstanding accuracy and optical performance combined with smart tools that make system easy to use, the OLS5100 laser microscope simplifies experiment workflows and delivers high-quality data users can rely on.

  • NanoIndenter
    Hysitron TS 77 Select

    Essential toolkit for quantitative nanoscale-to-microscale mechanical and tribological characterization.

    NANOMECHANICAL & NANOTRIBOLOGICAL TEST SYSTEM

    Hysitron TS 77 Select Nanoindenter

    The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales. Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.

    Essential
    suite of core testing techniques
    Includes nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and in-situ SPM imaging.

    Proven
    capacitive transducer technology
    Delivers high sensitivity with low thermal drift for reliable mechanical characterization over nanometer-to-micrometer length scales.

    Intuitive
    control software and operation
    Enables reliable measurements by technician-level operators.

    TS 77 Select Design

    1. Color optics
    2. Sample chuck
    3. Anti-vibration
    4. Environmental enclosure
    5. Piezo scanner
    6. Capacitive transducer
    7. Sample translation staging
    8. Granite frame

    TS 77 Select testing modes: Your essential toolkit

    Nanoindentation - High-Precision Mechanical Characterization
    Characterize the elastic modulus, hardness, creep, stress relaxation, and fracture toughness of localized microstructures, interfaces, small surface features, and thin films.

    In-Situ SPM Imaging - Enabling Superior Nanomechanics

    Utilizes the same probe to raster the sample surface for topography imaging as it does to conduct the nanomechanical test, ensuring superior nanomechanical characterization results, data reliability, and nanometer precision test placement accuracy.

    Mechanical Property Mapping - High-Speed Mapping and Fast Data Acquisition

    Delivers high-speed testing capabilities, up to 180x faster than traditional nanoindentation measurements. At two nanoindentation tests per second, high-resolution mechanical property maps of inhomogeneous materials can be obtained within minutes.

    Wear Testing - Quantitative Nanoscale Wear Resistance
    Quantitative wear volumes and wear removal rates can be measured as a function of applied contact force, sliding speed, and number of passes. Due to the scale of testing, tribological performance of individual microstructures, interfaces, and thin films can readily be measured.

    Hysitron TS Select Options

    Dynamic Nanoindentation - Depth Profiling, Viscoelastic Properties

    Dynamic nanoindentation superimposes a small oscillatory force over a quasi-static force component to obtain a continuous measurement of hardness and modulus as a function of depth into a material’s surface. The dynamic nanoindentation option includes a capacitive transducer optimized for dynamic measurements and controller electronics to deliver superior results as a function of testing depth, frequency, and time.

    Nanoscratch - Friction, Mar Resistance, and Thin Film Adhesion
    Nanoscratch utilizes an electrostatically actuated two-dimensional transducer to apply a normal force in a controlled fashion while simultaneously measuring the force required to move the tip laterally across the sample surface. The nanoscratch option does not rely on motorized staging for lateral movement, providing the most sensitive and reliable nanoscale friction and thin film adhesion measurements in the market.

    TS 77 Select Control Software

    Streamlined system operation and data analysis
    Bruker’s TS Select control and analysis software package was specifically developed to simplify the measurement process; from loading samples and test set-up to measurement execution and data analysis. TS Select control software incorporates automated sample testing and instrument calibration routines for simple, highthroughput, and mistake-free characterization.

    For more information, please visit:
    https://www.bruker.com/en/products-and-solutions/test-and-measurement/nanomechanical-test-systems/hysitron-ts-77-select-nanoindenter.html

  • NanoIndenter
    Hysitron TI Premier

    Versatile nanomechanical test instrument for advanced material characterization

    NANOMECHANICAL & NANOTRIBOLOGICAL TEST INSTRUMENT
    Hysitron TI Premier Nanoindenter
    Bruker’s Hysitron TI Premier nanoindenter was specifically designed to deliver industry-leading, quantitative nanomechanical characterization within a compact platform. Built upon proven Hysitron technology, the TI Premier provides a broad suite of nanoscale mechanical and tribological testing techniques. Routine measurements to advances research can be accomplished utilizing the versatile base configurations of TI Premier, while numerous technique upgrade options are available to meet the demands of your future characterization needs.

    Powerful
    characterization packages
    Provides tailored solutions for quasi-static nanoindentation, dynamic characterization, high-temperature characterization, and testing over multiple length scales.

    Proven
    Hysitron technology
    Ensures accurate, reliable, quantitative mechani